What type of electron microscope is used to study fine details of cell surfaces?

The Scanning Electron Microscope (SEM) is specifically designed to study the fine details of cell surfaces. This type of electron microscope provides three-dimensional images of samples by scanning them with a focused beam of electrons. As the beam interacts with the specimen, secondary electrons are emitted, which are collected to form a high-resolution image.

One of the key advantages of SEM is its ability to produce detailed topographical images, making it an invaluable tool for examining the surface structures and characteristics of cells at a very high magnification. This is particularly useful for studying cell membranes, surface proteins, and any external structures, such as cilia or flagella, that are important for cell function and interaction with their environment.

In contrast, the Transmission Electron Microscope (TEM) is better suited for examining the internal structures of cells, as it provides images by transmitting electrons through a thinly sliced specimen. Other microscopes like the Atomic Force Microscope (AFM) serve different purposes, such as measuring forces between a sharp probe and the sample surface, or characterizing samples at the nanoscale without relying on electron beams. The Phase Contrast Microscope is primarily used for live cell imaging to enhance contrast in unstained, transparent specimens, thereby focusing on different applications than